Apek Mulay is Business and Technology Consultant at Mulay's Consultancy Services. He is a senior analyst, blogger, entrepreneur and macroeconomist in the US semiconductor industry. He completed his MSEE at Texas Tech University, Lubbock and is sole author of the patent "Surface Imaging with Materials Identified by Colors." He has worked as a failure analyst in advanced CMOS technology development team at Jack Kilby Labs of Texas Instruments Inc. He is USCIS approved for US permanent residency under the category of foreign nationals with their extraordinary abilities in science and technologies without pursuing a PhD in engineering. He contributes to recognized publications such as Truthout, EBN, Semiwiki, electronics.ca publications, EDFAS Journal, PROUT Globe and Military & Aerospace Electronics Magazine. He is author of two books, Mass Capitalism: A Blueprint for Economic Revival and Sustaining Moore's Law: Uncertainty Leading to a Certainty of IoT Revolution.