Truthout

Apek Mulay

Apek Mulay

Apek Mulay is a senior analyst and Macroeconomist of US Semiconductor Industry. He completed his MSEE at Texas Tech University, Lubbock and is sole author of the patent “Surface Imaging with Materials Identified by Colors”. He has worked as a Failure Analyst in advanced CMOS technology development team at Jack Kilby Labs of Texas Instruments Inc. He is USCIS approved for US permanent residency under category of foreign nationals with their extraordinary abilities in science and technologies without pursuing PhD in engineering. He contributes to recognized publications such as Truth-out.org, EBN, Semiwiki, electronics.ca publications, EDFAS Journal, PROUT Globe and Military & Aerospace electronics Magazine. He is authoring a book titled "Sustaining Moore's Law: The Macroeconomics of US Microelectronics Industry." http://apekmulay.com/macro-economics-in-micro-electronics-industry/